Product Features: ◆Large contact area, low contact resistance(<100mΩ) and high electrical performance contribute to test yield improvement. ◆Very short electrical path ensures reduction in signal taransition time. ◆High pin count up to over 3000pins can be handled. ◆Mixed hole sizes possible on the same sheet. ◆As fine as 0.2mm contact pitch is available, using laser drilling technology. ◆Using low cost materials and simple architecture provide low cost ownership ◆Detection of missing device balls is possible with flat top surface of contact pin. ◆Soft touch with device ball minimizes ball damage.
Sharp, Sony, others